COUCHES MINCES DE TELLUREMEDYANIK VN; RESHETOVA LN; SULA GV et al.1976; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1976; NO 3; PP. 265; BIBL. 1 REF.Article

STRUCTURE OF NICKEL FILMS ELECTRODEPOSITED ON COPPER SINGLE CRYSTAL.UEDA Y.1974; JAP. J. APPL. PHYS.; JAP.; DA. 1974; VOL. 13; NO 4; PP. 729-730; BIBL. 4 REF.Article

NBN FILMS PREPARED BY MAGNETRON SPUTTERINGAKUNE T; SAKAMOTO N; SHIBUYA Y et al.1982; JPN. J. APPL. PHYS.; ISSN 0021-4922; JPN; DA. 1982; VOL. 21; NO 5; PART. 1; PP. 772-775; BIBL. 27 REF.Article

THE INITIAL STAGES OF EPITAXIAL GROWTH OF (111) AG ON (111) CU.VOOK RW; HORNG CT.1976; PHILOS. MAG.; G.B.; DA. 1976; VOL. 33; NO 5; PP. 843-861; BIBL. 26 REF.Article

CONTRIBUTION A L'ETUDE DES DIAGRAMMES DE KOSSEL. APPLICATION A L'ETUDE DES TRICHITES ET DES DEPOTS ELECTROLYTIQUES DE NICKEL SUR UN SUBSTRAT DE CUIVRE.NGUYEN MANH HOAT.1974; AO-CNRS-10214; FR.; DA. 1974; PP. (86P.); BIBL. 3 P. 1/2; (THESE DOCT.-ING.; NANTES)Thesis

High precision LEED structure analysis of ultra-thin epitaxial fcc Fe films on Cu(100)MÜLLER, S; BAYER, P; KINNE, A et al.Surface science. 1995, Vol 322, Num 1-3, pp 21-33, issn 0039-6028Article

A STATIC-SIMS STUDY OF THIN NICKEL FILM ON COPPER SUBSTRATETOYOKAWA F; TAGO N; KIKUCHI T et al.1983; SURFACE SCIENCE; ISSN 0039-6028; NLD; DA. 1983; VOL. 124; NO 1; PP. 297-304; BIBL. 11 REF.Article

FT-IR SURFACE ELECTROMAGNETIC WAVES (SEW) ABSORPTION SPECTROSCOPY OF VERY THIN FILMS ON METALSZHIZHIN GN; MOSKALOVA MA; SIGAREV AA et al.1982; OPTICS COMMUNICATIONS; ISSN 0030-4018; NLD; DA. 1982; VOL. 43; NO 1; PP. 31-36; BIBL. 15 REF.Article

LOW TEMPERATURE DEPOSITION OF TAB AND TAB₂ BY CHEMICAL VAPOR DEPOSITIONMOTOJIMA S; KITO K; SOGIYAMA K et al.1982; J. NUCLEAR MATER.; ISSN 0022-3115; NLD; DA. 1982; VOL. 105; NO 2-3; PP. 262-268; BIBL. 13 REF.Article

LOW-ENERGY ELECTRON DIFFRACTION FROM CLOSE-PACKED NA = DIFFRACTION D'ELECTRONS LENTS PAR NA COMPACTLINDGREN SA; PAUL J; WALLDEN L et al.1982; JOURNAL OF PHYSICS. C. SOLID STATE PHYSICS; ISSN 0022-3719; GBR; DA. 1982; VOL. 15; NO 30; PP. 6285-6291; BIBL. 13 REF.Article

MANGANESE OVERLAYERS ON COPPER (100): A STUDY BY LEED, AES AND UPSBINNS C; NORRIS C.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 116; NO 2; PP. 338-350; BIBL. 28 REF.Article

AUGER ANALYSIS OF THICK SILVER FILMS AND OF SILVER LAYERS GROWN ON COPPER = SPECTROMETRIE AUGER DES FILMS ET COUCHES EPAIS D'AG SUR CUNAMBA Y; VOOK RW.1981; THIN SOLID FILMS; ISSN 0040-6090; CHE; DA. 1981; VOL. 82; NO 2; PP. 165-177; BIBL. 10 REF.Article

AN ELECTRON-MICROSCOPY STUDY OF THE A15 NB₃GE SUBSTRATE INTERFACE = ETUDE PAR MICROSCOPIE ELECTRONIQUE DE L'INTERFACE A15 NB₃GE SUPPORTANTONOVSKY A; TOTH LE; BRADFORD B et al.1980; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1980; VOL. 51; NO 2; PP. 1111-1115; BIBL. 16 REF.Article

PRODUCTION OF THIN TUNGSTEN FILMS.BALALIKIN NI; BUCH J; KATRASEV VV et al.1976; THIN SOLID FILMS; NETHERL.; DA. 1976; VOL. 38; NO 3; PP. 255-260; BIBL. 6 REF.Article

EPITAXY OF CUI ON CU (111)DICENZO SB; WERTHEIM GK; BUCHANAN DNE et al.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 40; NO 10; PP. 888-890; BIBL. 4 REF.Article

FILM GROWTH AND MAGNETIC ANISOTROPY OF THIN NI ELECTRODEPOSITS ON (001) CU FILMSKURIKI S.1979; PHYS. STATUS SOLIDI, A; DDR; DA. 1979; VOL. 51; NO 1; PP. 227-233; ABS. GER; BIBL. 24 REF.Article

ESCA INTERFACE STUDY OF ION-PLATED AND THERMALLY EVAPORATED SELENIUM FILMS.RAVEN MS.1978; J. PHYS. D; G.B.; DA. 1978; VOL. 11; NO 5; PP. 631-642; BIBL. 14 REF.Article

THE CHARACTERISTICS OF EPITAXIAL OVERGROWTHS OF CUPROUS SULFIDE FORMED ON COPPER FILMS INVESTIGATED BY REFLECTION HIGH ENERGY ELECTRON DIFFRACTIONCAIN OJ; VOOK RW.1978; THIN SOLID FILMS; NLD; DA. 1978; VOL. 51; NO 3; PP. 373-389; BIBL. 18 REF.Article

ELECTROCRYSTALLIZATION OF CADMIUM ON COPPER SINGLE CRYSTAL PLANES UNDER THE INFLUENCE OF AN ASYMMETRIC ALTERNATING CURRENT.AHMED MF; PUSHPANADEN F.1977; J. CRYST. GROWTH; NETHERL.; DA. 1977; VOL. 41; NO 1; PP. 77-83; BIBL. 15 REF.Article

CROISSANCE DE TRICHITES D'OXYDES ET DIMINUTION DE L'ACTIVITE D'OXYDATION A LA SURFACE DE POUDRES DE FER ET DE CUIVREINUI T; UEDA T; SUEHIRO M et al.1977; NIPPON KAGAKU KAISHI; JAP.; DA. 1977; NO 12; PP. 1804-1810; ABS. ANGL.; BIBL. 18 REF.Article

ADHESION OF FILMS OF MOS₂ TO OXIDIZED METAL SURFACES.STUPIAN GW; CHASE AB.1977; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1977; VOL. 14; NO 5; PP. 1146-1152; BIBL. 16 REF.Article

INTERFACE KINETICS OF THE GROWTH AND EVAPORATION OF ICE SINGLE CRYSTALS FROM THE VAPOUR PHASE. II: MEASUREMENTS IN A PURE WATER VAPOUR ENVIRONMENTBECKMANN W; LACMANN R.1982; J. CRYST. GROWTH; ISSN 0022-0248; NLD; DA. 1982; VOL. 58; NO 2; PP. 433-442; BIBL. 23 REF.Article

AUGER LINE SHAPE CHANGES IN EPITAXIAL (111) PD/(111) CU FILMSCHAO SS; KNABBE EA; VOOK RW et al.1980; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1980; VOL. 100; NO 3; PP. 581-589; BIBL. 18 REF.Article

EXPERIMENTAL ASPECTS OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON MICROSCOPY. II. ESTIMATION OF CONTRAST DEPTH.YAMAMOTO T.1977; PHYS. STATUS SOLIDI, A; ALLEM.; DA. 1977; VOL. 44; NO 2; PP. 467-476; ABS. ALLEM.; BIBL. 18 REF.Article

CRYSTAL GROWTH OF CHEMICAL CO-P AND ELECTRODEPOSITED CO ON NI AND CU SINGLE CRYSTALS. I. (001) FACESCAVALLOTTI P; NOER S.1976; J. MATER. SCI.; G.B.; DA. 1976; VOL. 11; NO 4; PP. 645-655; BIBL. 46 REF.Article